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[IC设计资料] 比较器稳定性分析

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发表于 2006-5-22 15:02:00 | 显示全部楼层 |阅读模式
【文件名】:06522@52RD_metastability.rar
【格 式】:rar
【大 小】:362K
【简 介】:Metastability is a problem that occurs in all latching comparators when the input is near the comparator decision point [3]. The problem occurs when the comparator takes more time to switch to a valid output state than is available in the sample interval. In order to calculate the probability of this happening, a simple model of the comparator latching process is first described. Figure 1 shows the simple circuit used to model the latch during
the latching process.
【目 录】:
1 Metastability


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发表于 2014-7-25 20:29:10 | 显示全部楼层
有没有中文版本的,可能看的更明白一些...
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