找回密码
 注册
搜索
查看: 1777|回复: 1

[IC设计资料] 比较器稳定性分析

[复制链接]
发表于 2006-5-22 15:02:00 | 显示全部楼层 |阅读模式
【文件名】:06522@52RD_metastability.rar
【格 式】:rar
【大 小】:362K
【简 介】:Metastability is a problem that occurs in all latching comparators when the input is near the comparator decision point [3]. The problem occurs when the comparator takes more time to switch to a valid output state than is available in the sample interval. In order to calculate the probability of this happening, a simple model of the comparator latching process is first described. Figure 1 shows the simple circuit used to model the latch during
the latching process.
【目 录】:
1 Metastability


本帖子中包含更多资源

您需要 登录 才可以下载或查看,没有账号?注册

×
发表于 2014-7-25 20:29:10 | 显示全部楼层
有没有中文版本的,可能看的更明白一些...
点评回复

使用道具 举报

高级模式
B Color Image Link Quote Code Smilies

本版积分规则

Archiver|手机版|小黑屋|52RD我爱研发网 ( 沪ICP备2022007804号-2 )

GMT+8, 2024-12-27 10:32 , Processed in 0.053314 second(s), 17 queries , Gzip On.

Powered by Discuz! X3.5

© 2001-2023 Discuz! Team.

快速回复 返回顶部 返回列表