RF Built-in Self Test of a Wireless Transmitter

ohyoung

RF frequency synthesizers and transmitters for
wireless system-on-chips have recently migrated to low-cost
deep-submicrometer CMOS processes that facilitate all-digital
implementations. In addition to all the benefits of lower power,
lower silicon cost, reduced board area, and improved performance
that the scaled CMOS integration entails, the testing costs for
RF performance and wireless standard compliance could also
be drastically reduced. In this brief, we propose a built-in self
test (BIST) method, which is based on the premise that the internal
frequency synthesizer and transmitter signals are in digital
format allowing for digital signal processing to ascertain the RF
performance without external test equipment. With the RF BIST
capability, millions of SoCs can be calibrated and tested in a
production environment using a low cost digital tester while benefiting
from increased test coverage and reduced test time and cost.
The presented techniques have been successfully implemented
in two generations of commercial digital RF processors: 130-nm
Bluetooth and 90-nm GSM single-chip radios.
【文件名】:07430@52RD_04100881.pdf
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