IEEE1149.1JTAG标准

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【文件名】:06615@52RD_IEEE1149.1.pdf
【格　式】:pdf
【大　小】:1333K
【简　介】:This standard defines a test access port and boundary-scan architecture for digital integrated circuits and for
the digital portions of mixed analog/digital integrated circuits. The facilities defined by the standard seek to
provide a solution to the problem of testing assembled printed circuit boards and other products based on
highly complex digital integrated circuits and high-density surface-mounting assembly techniques. They
also provide a means of accessing and controlling design-for-test features built into the digital integrated circuits
themselves. Such features might, for example, include internal scan paths and self-test functions as
well as other features intended to support service applications in the assembled product.
【目　录】: