EMC Testing -- Part 5

paulyoung

Table of contents for this Part

5   Conducted RF immunity
5.1     Non-CE issues with immunity testing
5.2     Introduction to conducted immunity testing
5.2.1   Injecting a reasonably accurate  RF voltage (or current)
5.2.2   Preventing leakage
5.2.3   The non-linear sensitivity of analogue and digital semiconductors to RF.
5.2.4   Determining an ‘engineering margin’
5.2.5   Monitoring  the  EUT  to  be  able  to  tell  when  its  performance  has  degraded  too much.
5.3     Alternative transducers and test methods


5.3.1   [unnecessary repetition] Close-field probes
5.3.2   Voltage injection probe
5.3.3   ‘Crosstalk’ injection techniques
5.3.4   Licensed radio transmitters
5.3.5   Bulk Current Injection (BCI)
5.3.6   Direct injection with a CDN
5.3.7   The ‘EM Clamp’
5.3.8   General notes on test set-ups
5.4     Signal generators and power amplifiers
5.4.1   Alternative types of signal generator
5.4.2   RF Power Amplifiers
5.5     Correlating alternative test methods with EN 61000-4-6
5.6     On-site testing
5.7     Full compliance conducted RF immunity testing
5.7.1   Generator
5.7.2   Transducers
5.7.3   Calibration and levels
5.7.4   Test setup
5.8     References

【文件名】:06124@52RD_EMC Testing - Part 5.pdf
【格　式】:pdf
【大　小】:838K
【简　介】:
【目　录】: