实用模拟电路设计

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【文件名】:06530@52RD_Section1.rar
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【简　介】:Over the last several years, single-supply operation has become an increasingly important requirement as systems get smaller, cheaper, and more portable.Portable systems rely on batteries, and total circuit power consumption is an important and often dominant design issue, and in some instances, more important than cost. This makes low-voltage/low supply current operation critical; at the same time, however, accuracy and precision requirements have forced IC manufacturers to meet the challenge of “doing more with less” in their amplifier designs.
【目　录】:
1.Rail-to-Rail Input Stages
2.Rail-to-Rail Output Stages
3.Single-Supply Instrumentation Amplifiers

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【文件名】:06530@52RD_Section2.rar
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【简　介】:Modern system design increasingly makes use of high speed ICs as circuit building blocks. With bandwidths going up and up, demands are placed on the designer for faster and more power efficient circuits. The default high speed amplifier has changed over the years, with high speed complementary bipolar (CB) process ICs such as the AD846 and AD847 in use just about ten years at this writing. During this time, the general utility/availability of these and other ICs have raised the “high speed” common performance denominator to 50MHz. The most recent extended
frequency complementary bipolar (XFCB) process high speed devices such as the AD8001/AD8002, the AD9631/9632 and the AD8036/AD8037 now extend the
operating range into the UHF region.
【目　录】:
1.Driving Capacitive Loads
2.Cable Driving
3.Single-Supply Considerations
4.Application Circuits

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【文件名】:06530@52RD_Section3.rar
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【简　介】:The trend in ADCs and DACs is toward higher speeds and higher resolutions at reduced power levels. Modern data converters generally operate on ±5V (dual supply) or +5V (single supply). There are now a few converters which operate on a single +3V supply. This trend has created a number of design and applications problems which were much less important in earlier data converters, where ±15V supplies were the standard.
【目　录】:
1.Sigma-Delta ADCs
2.High Resolution, Low Frequency Measurement ADCs

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【文件名】:06530@52RD_Section4.rar
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【简　介】:Modern high speed sampling ADCs are designed to give low distortion and wide dynamic range in signal processing systems. Realization of specified performance levels depends upon a number of factors external to the ADC itself, including proper design of any necessary support circuitry. The analog input drive circuitry is especially critical, because it can degrade the inherent ADC dynamic performance if not designed properly.
【目　录】:
1.ADC Dynamic Considerations
2.Selecting the Drive Amplifier Based on ADC Dynamic Performance
3.Driving Flash Converters
4.Driving the AD9050 Single-Supply ADC
5.Driving ADCs with Switched Capacitor Inputs
6.Gain Setting and Level Shifting
7.External Reference Voltage Generation
8.ADC Input Protection and Clamping
9.Applications for Clamping Amplifiers
10.Noise Considerations in High Speed Sampling ADC Applications

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【文件名】:06530@52RD_Section5.rar
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【简　介】:An exciting new application for wideband, low distortion ADCs is called undersampling, harmonic sampling, bandpass sampling, or Super-Nyquist Sampling. To understand these applications, it is necessary to review the basics of the sampling process.
【目　录】:
1.Fundamentals of Undersampling
2.Increasing ADC SFDR and ENOB using External SHAs
3.Use of Dither Signals to Increase ADC Dynamic Range
4.Effect of ADC Linearity and Resolution on SFDR and Noise in Digital Spectral Analysis Applications
5.Future Trends in Undersampling ADCs

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【文件名】:06530@52RD_Section6.rar
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【简　介】:There are many applications for data acquisition systems in measurement and process control. All data acquisition applications involve digitizing analog signals for analysis using ADCs. In a measurement application, the ADC is followed by a digital processor which performs the required data analysis. In a process control application, the process controller generates feedback signals which typically must be converted back into analog form using a DAC.
【目　录】:
1.Data Acquisition System Considerations
2.Multiplexing
3.Filtering Considerations for Data Acquisition Systems
4.SHA and ADC Settling Time Requirements in Multiplexed Applications
5.Complete Data Acquisition Systems on a Chip
6.Multiplexing into Sigma-Delta ADCs
7.Simultaneous Sampling Systems
8.Data Distribution Systems using Multiple DACs

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【文件名】:06530@52RD_Section7.rar
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【简　介】:One of the most commonly asked applications questions is: “What happens if external voltages are applied to an analog integrated circuit with the supplies turned off?” This question describes situations that can take on many different forms: from lightning strikes on cables which propagate very high transient voltages into signal conditioning circuits, to walking across a carpet and then touching a printed circuit board full of sensitive precision circuits. Regardless of the situation,the general issue is the effect of overvoltage stress (and, in some cases, abuse) on analog integrated circuits. The discussion which follows will be limited in general to operational amplifiers, because it is these devices that most often interface to the
outside world. The principles developed here can and should be applied to all analog integrated circuits which are required to condition or digitize analog waveforms.These devices include (but are not limited to) instrumentation amplifiers, analog comparators, sample-and-hold amplifiers, analog switches and multiplexers, and analog-to-digital converters.
【目　录】:
1.Amplifier Input Stage Overvoltage
2.Amplifier Output Voltage Phase Reversal
3.Understanding and Protecting Integrated Circuits from Electrostatic Discharge (ESD)

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【文件名】:06530@52RD_Section8.rar
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【简　介】:Dynamic range of an op amp may be defined in several ways. The most common ways are to specify Harmonic Distortion, Total Harmonic Distortion (THD), or Total Harmonic Distortion Plus Noise (THD + N).
Harmonic distortion is measured by applying a spectrally pure sinewave to an op amp in a defined circuit configuration and observing the output spectrum. The amount of distortion present in the output is usually a function of several
parameters: the small- and large-signal nonlinearity of the amplifier being tested,the amplitude and frequency of the input signal, the load applied to the output of the amplifier, the amplifier's power supply voltage, printed circuit board layout,grounding, power supply decoupling, etc. Therefore, any distortion specification is relatively meaningless unless the exact test conditions are specified.
【目　录】:
1.High Speed Op Amp Distortion
2.High Frequency Two-Tone Generation
3.Using Spectrum Analyzers in High Frequency Low Distortion Measurements
4.Measuring ADC Distortion using FFTs
5.FFT Testing
6.Troubleshooting the FFT Output
7.Analyzing the FFT Output
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【文件名】:06530@52RD_Section9.rar
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【简　介】:While there is no doubt that computer analysis is one of the most valuable tools that the analog designer has acquired in the last decade or so, there is equally no doubt that analog circuit models are not perfect and must be verified with hardware. If the initial test circuit or "breadboard" is not correctly constructed, it may suffer from malfunctions which are not the fault of the design but of the physical structure of the breadboard itself. This section considers the art of successful breadboarding of high performance analog circuits.
【目　录】:
1.Prototyping Analog Circuits
2.Evaluation Boards
3.Noise Reduction and Filtering for Switching Power Supplies
4.Low Dropout References and Regulators
5.EMI/RFI Considerations
6.Sensors and Cable Shielding