差分信号的测试与仿真

Dawney

【文件名】:06523@52RD_A Test Bench for Differential Circuits.zip
【格　式】:zip
【大　小】:110K
【简　介】:Consider the test bench shown in Figure 1.This test bench, or some variation of it, iscommonly used when simulating differential circuits. While it does generally get the job done, it has a number of short comings. First, driving the device-under-test, or DUT,with a purely differential input requires that the stimulus be applied from two sources,Vdm1 and Vdm2. Doing so is somewhat of a bother, and represents a potential source of error. If the stimulus is only applied to one source, or if the stimuli are applied differently
from both sources, then the signals that drive the DUT will contain an undesired common-mode component that can cause erroneous results. In addition, determining the differential output signal requires measuring a floating voltage, again this is somewhat of a bother because many waveform viewing tools do not make displaying floating signals as easy as they should.
【目　录】:
1.0 The Traditional Test Bench
2.0 The New Test Bench
3.0 Applying the Test Bench
4.0 Summary

aisen_lv

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