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[IC设计资料] ieee的TAP和边界扫描

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发表于 2006-5-12 11:42:00 | 显示全部楼层 |阅读模式
【文件名】:06512@52RD_00938734.rar
【格 式】:rar
【大 小】:1080K
【简 介】:Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined,including a boundary-scan register, such that the component is able to respond to a minimum set
of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that allows rigorous description of the component-specific aspects of such testability features.
【目 录】:无目录


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