High Temperature Operating Life (HTOL)
Early Life Failure Rate (ELFR) Study
Write Erase Cycling
Data Retention Bake
Temperature Cycling (T/C)
Temperature/Humidity/Bias (THB)
Autoclave (AC)
Highly Accelerated Stress Test (HAST)
Surface Mount Preconditioning
Electrostatic Discharge (ESD)
Latch-up (LU)
Gate Leakage (GL)
IP卡
狗仔卡
发表于 2010-3-28 18:26:06
提升卡
置顶卡
沉默卡
喧嚣卡
变色卡
显身卡