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[综合资料] HP test and measurement(English)

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发表于 2005-9-9 08:28:00 | 显示全部楼层 |阅读模式
简介:This application note is based on an article written for the
February 1967 issue of the Hewlett-Packard Journal, yet
its content remains important today. S-parameters are an
essential part of high-frequency design, though much else
has changed during the past 30 years. During that time,
HP has continuously forged ahead to help create today's
leading test and measurement environment
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大小:1326K
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