传一些Testing技术资料

Patricia

【文件名】:06427@52RD_Analog Circuit Testing.rar
【格　式】:rar
【大　小】:881K
【简　介】:Analog Circuit Testing
• Test Problems
• Basic Components / Parameters
• Test Methods
− DSP Based
− Design for Test
− Built-in Self-Test
− Algorithmic Method
【目　录】:无目录

Patricia

【文件名】:06427@52RD_VLSI Testing.rar
【格　式】:rar
【大　小】:41K
【简　介】:1. Digital System Testing and Testable Design, 1990, By M.
Abramovici, M.A. Breuer & A.D. Friedman.
2. Logic Testing and Design for Testability, 1985, By Hideo
Fujiwara.
3. Proceedings in ≧ 30 Conferences/Symposiums/Workshops
supported by IEEE each year.
4. International Journals: IEEE T-CAD, T-VLSI, T-C&S, TComputers,
JETTA, etc.
【目　录】:无目录

Patricia

【文件名】:06427@52RD_CPU Testing & Testable Design.rar
【格　式】:rar
【大　小】:163K
【简　介】:CPU Testing & Testable Design
• Problems in CPU Testing
• Test Strategies for CPU
• Testable CPU Architectures
• Testable Design Flow
【目　录】:无目录

Patricia

【文件名】:06427@52RD_Design For Testability.rar
【格　式】:rar
【大　小】:210K
【简　介】:Design for Testability
• Testability Measurement
• DFT Basics
• DFT Techniques
– ad hoc
– Scan design
– Boundary scan
【目　录】:无目录